A METHOD FOR THE MEASUREMENT OF CAPACITANCE, SERIES AND SHUNT RESISTANCES OF SEMICONDUCTOR JUNCTIONSPOPKIROV G.1981; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1981; VOL. 14; NO 9; PP. 1048-1049Article

A STUDY OF THE METAL-IONIC CONDUCTOR INTERFACE CAPACITANCES. I: EXPERIMENTAL METHODCOUTURIER G; DANTO Y; HAKAM A et al.1981; SOLID STATE IONICS; ISSN 0167-2738; NLD; DA. 1981; VOL. 2; NO 2; PP. 115-120; BIBL. 13 REF.Article

EXTENSION OF AN OLD CIRCULATOR MODELVESZELY G.1981; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1981; VOL. 29; NO 10; PP. 1109-1111; BIBL. 4 REF.Article

AN IMPROVED CIRCUIT MODEL FOR MONOLITHIC CRYSTAL FILTERSDWORSKY L.1981; IEEE TRANS. SONICS ULTRASON.; ISSN 0018-9537; USA; DA. 1981; VOL. 28; NO 4; PP. 283-285; BIBL. 2 REF.Article

INVESTIGATION INTO TEMPERATURE VARIATION OF EQUIVALENT-CIRCUIT PARAMETERS OF AT-CUT QUARTZ CRYSTAL RESONATORSHOLBECHE RJ; MORLEY PE.1981; IEE PROC., A; ISSN 0143-702X; GBR; DA. 1981; VOL. 128; NO 7; PP. 507-510; BIBL. 6 REF.Article

OPEN-END DISCONTINUITY IN SHIELDED MICROSTRIP CIRCUITSBEDAIR SS; SOBHY MI.1981; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1981; VOL. 29; NO 10; PP. 1107-1109; BIBL. 4 REF.Article

NOVEL LOSSLESS SYNTHETIC FLOATING INDUCTOR EMPLOYING A GROUNDED CAPACITORSENANI R.1982; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1982; VOL. 18; NO 10; PP. 413; BIBL. 11 REF.Article

COUPLING CAPACITANCES FOR TWO-DIMENSIONAL WIRESDANG RLM; SHIGYO N.1981; ELECTRON DEVICE LETT.; ISSN 0193-8576; USA; DA. 1981; VOL. 2; NO 8; PP. 196-197; BIBL. 7 REF.Article

DETERMINATION OF CIRCULAR MICROSTRIP FISC BY NOBLE'S VARIATIONAL METHODLEONG MS; KOOI PS; YEO KP et al.1981; IEE PROC., PART H; ISSN 0143-7097; GBR; DA. 1981; VOL. 128; NO 6; PP. 306-310; BIBL. 14 REF.Article

PSEUDOACTIVE BRIDGE FOR SEPARATION OF R AND C IN A PRACTICAL CAPACITIVE/CONDUCTIVE TRANSDUCERPADMANABHAN K; SOMAYAJULU SARMA GS.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 19; PP. 705-706; BIBL. 2 REF.Article

NOISE SPIKES IN DIGITAL VLSI CIRCUITSWALLMARK JT.1982; IEEE TRANS. ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1982; VOL. 29; NO 3; PP. 451-458; BIBL. 18 REF.Article

UNSYMMETRIC BROADSIDE-COUPLED STRIPLINESKITAZAWA T; KUMAGAMI H; HAYASHI Y et al.1982; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1982; VOL. 18; NO 10; PP. 425-426; BIBL. 5 REF.Article

INDUCTIVE AND CAPACITIVE N-PORTS = MULTIPOLES INDUCTIFS ET CAPACITIFSREZA FM.1981; AEUE ARCH. ELEKTRON. UEBERTRAGUNGSTECH.; ISSN 0001-1096; DEU; DA. 1981; VOL. 35; NO 12; PP. 468-472; ABS. GER; BIBL. 6 REF.Article

THE EFFECT OF ION INDUCED ROUGHNESS ON THE DEPTH RESOLUTION OF AUGER SPUTTER PROFILING OF MNOS DEVICESADACHI T; HELMS CR.1981; J. VAC. SCI. TECHNOL.; ISSN 0022-5355; USA; DA. 1981; VOL. 19; NO 1; PP. 119; BIBL. 3 REF.Article

TWO LIMITING VALUES OF THE CAPACITANCE OF SYMMETRICAL RECTANGULAR COAXIAL STRIP TRANSMISSION LINERIBLET HJ.1981; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1981; VOL. 29; NO 7; PP. 661-666; BIBL. 12 REF.Article

A RESONANCE METHOD FOR THE BROAD-BAND CHARACTERIZATION OF GENERAL TWO-PORT MICROSTRIP DISCONTINUITIESRIZZOLI V; LIPPARINI A.1981; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1981; VOL. 29; NO 7; PP. 655-660; BIBL. 16 REF.Article

FABRICATION OF CATHETER-TIP AND SIDEWALL MINIATURE PRESSURE SENSORSESASHI M; KOMATSU H; MATSUA T et al.1982; IEEE TRANS. ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1982; VOL. 29; NO 1; PP. 57-63; BIBL. 7 REF.Article

INFLUENCE OF WATER ON THE CAPACITANCE/POTENTIAL DISTRIBUTION AT THE TIO₂/CH₃CN JUNCTIONHEINZEL AB; TESCHNER DM; SCHUMACHER R et al.1981; BER. BUNSENGES. PHYS. CHEM.; ISSN 0005-9021; DEU; DA. 1981; VOL. 85; NO 12; PP. 1117-1119; BIBL. 16 REF.Article

A NEW CAPACITANCE TECHNIQUE FOR QUALITY CONTROL OF NONMETALLIC MATERIALS AND STRUCTURESMATISS IG.1982; MATER. EVAL.; ISSN 0025-5327; USA; DA. 1982; VOL. 40; NO 3; PP. 299-304; BIBL. 9 REF.Article

ELECTRICAL BREAKDOWN IN DOUBLE-LAYER CAPACITOR SYSTEMSSADIQ MM.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 76; NO 4; PP. 335-338; BIBL. 4 REF.Article

CALCUL PRECIS DES PERMEANCES: APPLICATION AUX ALTERNATEURS A MOYENNE FREQUENCENICOLAIDE A; BUNEA V.1981; RGE. REV. GEN. ELECTR.; ISSN 0035-3116; FRA; DA. 1981; NO 9; PP. 623-633; ABS. ENG; BIBL. 23 REF.Article

CAPACITY, CUTOFF RAT, AND CODING FOR A DIRECT-DETECTION OPTICAL CHANNELMASSEY JL.1981; IEEE TRANS. COMMUN.; ISSN 0090-6778; USA; DA. 1981; VOL. 29; NO 11; PP. 1615-1621; BIBL. 14 REF.Article

TRAPPING STATES IN THIN FILM TRANSISTORS MEASURED BY THERMALLY STIMULATED CURRENTSKIMMINS ST; ANDERSON JC.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 79; NO 2; PP. 137-147; BIBL. 13 REF.Article

WASSERKONTROLLE UNTER VERWENDUNG VON KAPAZITAETS- UND WIDERSTANDSMESSUNGEN = CONTROLE DE LA PURETE DE L'EAU A L'AIDE DE MESURES DE CAPACITE ET DE RESISTANCEWOBKING H.1981; OESTERR. ING.-Z.; ISSN 0029-9219; AUT; DA. 1981; VOL. 24; NO 10; PP. 361-366; BIBL. 16 REF.Article

BOUNDARY INTEGRAL EQUATION ANALYSIS OF TRANSMISSION-LINE SINGULARITIESINGHAM DB; HEGGS PJ; MANZOOR M et al.1981; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1981; VOL. 29; NO 11; PP. 1240-1243; BIBL. 9 REF.Article